Test Data Reduction
W. E. Ham · IEEE Transactions on Manufacturing Technology · 1976
The general problem of reducing data available in the integrated circuit environment is addressed. One can consider the circuit to be essentially composed of identification and performance data. Opportunities exist at every level of manufacturing and testing to aid in the final interpretation of the results. Without disturbing the technology or actual circuit design, some general methods for improving testing techniques are discussed. Examples of data reduction and presentation techniques are given where relation between performance and identification can be seen.