Test generation for data-path logic: the F-path method
S. Freeman · IEEE Journal of Solid-State Circuits · 1988
Tests for data-path logic can be generated with the aid of high-level methods that utilize the presence of special forms of sensitized paths. These paths, called fault paths (F-paths), are defined so that they transmit fault information with certainty. Their presence can be determined from the functional definition of a block, and when, exceptionally, they are absent, a minimum hardware addition usually suffices to provide them. They permit use of powerful, computer-aided test generation methods that have permitted routine targeting of 100% coverage of an expanded fault set (more than just stuck-ats), verification of success by simple postprocessing of RTL (resistor-transistor logic)-level good-logic simulation.>