At-speed boundary-scan interconnect testing in a board with multiple system clocks
Jongchul Shin, Hyunjin Kim, Sungho Kang · 1999
As an at-speed solution to board-level interconnect test-ing, an enhanced boundary-scan architecture utilizing a combination of slightly modified boundary-scan cells and a user-defined register is proposed. Test methods based on the new architecture can accomplish cost-effective at-speed testing and propagation delay measurements on board-level interconnects. Particularly when the board under test has multiple domains of interconnects controlled by differ-ent clock speeds, our at-speed solution is much more effi-cient than other previous works. 1.