Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology
Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Hans Tsai, Janusz Rajski · Proceedings/Proceedings - International Test Conference · 2006
With feature sizes shrinking, manufacturing defects and parameter variations often cause design timing failures. Crosstalk coupling is one of such causes. It is essential that timing failures be correctly and quickly diagnosed. The authors present a methodology to diagnose the delay-defect in presence of crosstalk, given the physical information such as crosstalk coupling capacitance, neighborhood information and SDF delay information. The authors provide diagnosis results for 180, 130, 90 and 65 nm technologies