Floating Gate B4-Flash Memory Technology Utilizing Novel Programming Scheme - Highly Scalable, Efficient and Temperature Independent Programming -
S. Shukuri, N. Ajika, M. Mihara, Yoshiki Kawajiri, Takashi Ogura, K. Kobayashi, T. Endoh, M. Nakashima · 2007
This paper demonstrates that B4-HE injection programming scheme can be easily evolved to a floating gate cell. By applying a moderate back bias to the cell during programming, the bit-line voltage can be reduced below the supply voltage, 1.8 V. As a result, B4-flash can achieves high speed programming comparable to conventional NOR and high programming efficiency comparable to NAND flash at the same time. Basic operations of the floating gate B4-flash cells have been investigated. It is also confirmed that B4-HE injection programming provides very weak temperature dependency in comparison with CHE and FN injection, and does not have a negative impact to its reliability.