Functional Broadside Templates for Low-Power Test Generation
Irith Pomeranz · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2013
This brief describes a new approach to low-power test generation targeting the maximum switching activity during the fast functional clock cycles of broadside tests. This brief defines functional broadside templates as incompletely-specified broadside tests, which capture the signal-transitions that occur during the fast functional clock cycles of functional broadside tests. The same signal-transitions can occur during functional operation. Therefore, functional broadside templates can guide the generation of low-power test sets when the goal is to match the power dissipation that is possible during functional operation on a line-by-line basis. This brief describes a procedure for computing functional broadside templates from completely-specified functional broadside tests, and a low-power test generation procedure for transition faults based on templates.