Using a CISC microcontroller to test embedded memories
Ad van de Goor, Said Hamdioui, Georgi Gaydadjiev · 2010
Small microcontroller-based systems are omnipresent. Often, they do not have Memory BIST (MBIST), or the MBIST is not available to the user. In such cases the CPU will be the only resource to perform at least the Power-On testing of the embedded memories. This paper highlights the capabilities and limitations of CISC architectures to apply at-speed memory tests.