Embedding test vectors in accumulator - based TPG using progressive search
Ioannis Voyiatzis, Constantinos E. Efstathiou, Cleo Sgouropoulou · 2013
In this paper we present a novel solution to the test vector-embedding problem for sequences generated by accumulators. The time overhead of the solution is of the order O(k), where k is an arbitrarily small constant. Comparisons with previously proposed schemes indicate that the proposed method results in lower test application time.