BIST test pattern generator for delay testing
Patrick Girard, C. Landrault, V. Moréda, S. Pravossoudovitch · Electronics Letters · 1997
To detect delay faults in a digital circuit requires a test sequence applied at the nominal frequency of the circuit. Built-in self-test (BIST) is a technique that provides such testing possibilities at speed, without expensive test equipments. A BIST test pattern generator (TPG) design, targeting the detection of delay faults is proposed.