Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process
Madhu Jain, Manju Kaushik, Gireesh Kumar · 2015
This investigation is concerned with the performance modeling of an embedded system in which two types of faults occurs. The concept of common cause failure is also taken into consideration to develop Markov model to analyze the reliability indices of software embedded system. The hardware components may fail due to two types of faults namely (i) permanent fault known as hard error and (ii) transient fault known as soft errors. The failed hardware components is repaired by a single repairman who is always available in the system. To obtain the system state probabilities governing the model of the embedded system, we employ Runge-Kutta method. A numerical illustration is also presented to validate the analytical and computational tractability of the proposed model. The effect of different parameters on the system performance indices are demonstrated graphically.