Antirandom Testing: A Distance‐Based Approach
ShenHui Wu, S. Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana · VLSI design · 2008
Random testing requires each test to be selected randomly regardless of the tests previously applied. This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. An algorithm for generating antirandom tests is presented. Compared with traditional pseudorandom testing, antirandom testing is found to be very effective when a high‐fault coverage needs to be achieved with a limited number of test vectors. The superiority of the new approach is even more significant for testing bridging faults.