CAD-based net capacitance testing of unpopulated MCM substrates
J. Marshall, Fred Chong, Douglas N. Modlin, S. Westbrook · IEEE Transactions on Components Packaging and Manufacturing Technology Part B · 1994
This paper presents an approach to CAD-based generation of expected test values for capacitive net verification in unpopulated multiple-chip modules (MCMs). The superposition model underlying the capacitance estimation technique is discussed along with implementation details and test results from CAD-based testing of DEC VAX-9000 MCMs.>