Exact closed form aliasing probability in class of multiple input signature registers
Geetani Edirisooriya, John P. Robinson · Electronics Letters · 1991
Linear feedback shift registers (LFSRs) are commonly used in built-in self-test schemes to compact the test response. Compaction introduces the problem of aliasing. An exact closed form expression for the aliasing probability for a class of multiple input LFSRs for equiprobable independent bit errors is derived.