A low cost method for testing offset and gain error for ADC BIST
Jingbo Duan, Degang J. Chen, R.L. Geiger · 2012
As the Systems-on-Chips (SoCs) complexity increases, test cost contributes more in the total cost. Especially, test of deeply embedded analog and mixed signal blocks are the most costly test. Built-In Self-Test (BIST) is considered as a low cost substitution of traditional production test. This paper presents a low cost method for testing ADC's offset and gain error. This is a complement of previous published linearity and spectral performance test methods. The simulation results show the method has good accuracy.