Reliable method for delay-fault diagnosis
Patrick Girard, C. Landrault, S. Pravossoudovitch · Electronics Letters · 1991
The class of faults known as delay faults is investigated. The diagnosis process is performed after the detection of a circuit malfunction. Unfortunately, the existing methods for locating timing failures on digital circuits have shown certain deficiencies. A new and perfectly reliable method for delay fault diagnosis, based on the symbolic simulation of the fault-free circuit, is presented.