Fault detection in CMOS circuits by consumption measurement
Mireille Jacomino, J.-L. Rainard, R. David · IEEE Transactions on Instrumentation and Measurement · 1989
Some testing problems in CMOS circuits are presented, including stuck-open and stuck-on faults, bridging faults, and excessive leakage in dynamic CMOS circuits. It is shown that the current consumption of a faulty CMOS circuit is several orders of magnitude greater than that of the fault-free circuit: hence, consumption measurement may be a suitable way of testing. Test by consumption measurement provides improved controllability and observability of some faults in comparison with the logic test.>