CMOS circuit testability
P.S. Moritz, L.M. Thorsen · IEEE Journal of Solid-State Circuits · 1986
CMOS circuits present unique testing problems. Although open faults in CMOS circuits can be statistically tested, a sequence of patterns is required to guarantee a test. In addition, connections in the circuit layout affect testability. An automatic test generator has been developed to generate test sequences which will detect open CMOS faults.