A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits
M.A. Breuer · IEEE Transactions on Computers · 1971
Two procedures are presented for generating fault detection test sequences for large sequential circuits. In the adaptive random procedure one can achieve a tradeoff between test generation time, length, and percent of circuit tested. An algorithmic path-sensitizing procedure is also presented. Both procedures employ a three-valued logic system. Some experimental results are given.