Testability consideration based on a test pattern length estimation
Shigeru Takasaki · Systems and Computers in Japan · 1987
Abstract A testability evaluation method is described based on an estimated test pattern length to obtain the desired fault coverage. The test pattern length is estimated from network attributes, i.e., No. of gates, No. of signal lines, No. of inputs/outputs, etc. The proposed method begins with modeling a fault coverage curve as a function of test patterns and a curve coefficient. The curve coefficient is described as a function of network attributes based on the previous execution data. The test patterns required to obtain the desired fault coverage can be estimated in the range of upper and lower bounds. The upper and lower bounds are obtained using the interpolation method. The proposed estimation method is evaluated from the relationships between estimated patterns and actual automatic test generation patterns.