A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a sigma-delta ADC
M.F. Toner, Gordon Walter Roberts · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 1996
Built-In-Self-Test (BIST) for VLSI systems is desirable for production-line testing and in-the-field diagnostics. This brief discusses a Mixed Analog-Digital BIST (MADBIST) for a frequency response test, a harmonic distortion test and an intermodulation distortion test of an analog-to-digital converter. The MADBIST strategy for the frequency response, harmonic distortion, and intermodulation distortion tests of the ADC is introduced, accuracy issues are discussed, and preliminary experimental results are presented.