On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression
Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung‐Terng Wang · 2013
Capture safety has become a major concern in at-speed scan testing since strong power supply noise caused by excessive launch switching activity (LSA) at transition launching in an at-speed test cycle often results in severe timing-failure-induced yield loss. Recently, a basic RM (rescue-&-mask) test generation scheme was proposed for guaranteeing capture safety rather than merely reducing LSA to some extent. This paper extends the basic RM scheme to broadcast-scan-based test compression by uniquely solving two test-compression-induced problems, namely (1) input X-bit insufficiency (i.e., fewer input X-bits are available for LSA reduction due to test compression) and (2) output X-bit impact (i.e., output X-bits may reduce fault coverage due to test response compaction). This leads to the broadcast-RM (broadcast-scan-based rescue-&-mask) test generation scheme. Evaluations on large benchmark circuits and an industrial circuit of about 1M gates clearly demonstrate that this novel scheme can indeed guarantee capture safety in at-speed scan testing with broadcast-scan-based test compression while minimizing its impact on both test quality and test costs.