On-line test for fault-secure fault identification
Samuel N. Hamilton, Alex Orailoğlu · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2000
In an increasing number of applications, reliability is essential. On-line resistance to permanent faults is a difficult and important aspect of providing reliability. Particularly vexing is the problem of fault identification. Current methods are either domain specific or expensive. We have developed a fault-secure methodology for permanent fault identification through algorithmic duplication without necessitating complete functional unit replication. Fault identification is achieved through a unique binding methodology during high-level synthesis based on an extension of parity-like error correction equations in the domain of functional units. The result is an automated chip-level approach with extremely low area and cost overhead.