SMARTGEN: the implementation of an expert system for the generation of digital logic diagnostic tests
Asad Karim, Stephen A. Szygenda · 1988
Test generation for digital logic can be traced back as early as 1959, to Eldred [1], although it lacked formalism at that time. Eldred presented the idea of single path sensitization. It didn't take long for the engineering community to come up with circuits, for which Eldred's approach failed to detect all detectable faults. This led to the development of the D-Algorithm for test generation, by P. Roth [2]. The D-Algorithm was based on mathematical foundations and provided a formal approach to test generation. It suggested the classical idea of test generation; namely, a simple search of the test circuit at the gate level.