Detection of stuck-at and bridging faults in reed—muller canonical (RMC) networks
Thyagaraju Damarla, Mark G. Karpovsky · IEE Proceedings E Computers and Digital Techniques · 1989
Boolean function realisations by Reed—Muller networks have many desirable properties in terms of testability [11]. In the paper it is shown that there exists a single set of test patterns which would detect all single stuck-at and all single bridging (short-circuit) faults in Reed-Muller networks, and the number of test patterns is shown to be at most 3n + 5, where n is the number of input variables in the function. In the case of networks with k outputs, where k ≤ 2n, the number of test patterns required to detect all single stuck-at and all single detectable bridging faults (both AND and OR) is also shown to be 3n + 5.