Polarization-entangled twin-photon ellipsometry
Kimani C. Toussaint, Ayman F. Abouraddy, Matthew T. Corbo, Alexander V. Sergienko, Bahaa E. A. Saleh, Malvin Carl Teich · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2002
The high accuracy required in traditional ellipsometric measurements necessitates the absolute calibration of both the source and the detector. We demonstrate that these requirements can be circumvented by using a non-classical source of light, namely, a twin-photon polarization-entangled source that produces type-II spontaneous parametric down-conversion, in conjunction with a novel polarization interferometer and coincidence-counting detection scheme. Our scheme exhibits two features that obviate the requirements of a calibrated source and detector. The first is the twin-photon nature of the source; we are guaranteed, on the detection of a photon in one of the arms of the setup, that its twin will be in the other, effectively serving as calibration of the source. The second is that the polarization entanglement of the source serves as an interferometer, thereby alleviating the need for calibrating the detector. The net result is that absolute ellipsometric data from a sample may be obtained. We present preliminary experimental results showing how the technique operates.