IDDQ and AC scan: the war against unmodelled defects
P.C. Maxwell, Robert C. Aitken, K.R. Kollitz, Alastair Brown · 2002
This paper investigates the relative effectiveness of scan-based AC tests, IDDQ tests and functional tests for the detection of defective chips, particularly those exhibiting delay faults. Data are presented from an experiment in which a production ASIC was tested with a number of scan and functional tests, together with IDDQ. Results show that all tests detect unique failures, indicating the presence of additional unmodelled faults. The effectiveness of the AC tests shows that targeting additional faults produces better quality than relying on peripheral coverage of existing tests.