Overall outage probability of two-way amplify-and-forward relaying in Nakagami-m fading channels
Xiaoming Xu, Yueming Cai, Chunxiao Cai, Wendong Yang · 2011
Analytic ally studying the overall outage performance of two-way amplify-and-forward (AF) relaying systems has always been a difficult task. In this paper we study the overall outage probability (OOP) for the two-way amplify-and-forward (AF) relaying system. The channels are independent but not identically Nakagami-m fading distributed. We obtain the tight closed-form OOP approximated expression for the system. Our results indicate that the tight closed-form approximation can march the simulation perfectly in large signal-to-noise ratios (SNRs). The theoretical analysis can be further applied to study the two-way multiple-relay systems in Nakagami-m fading channels.