Plug-and-play I/sub DDQ/ Testing for test fixtures
Ke Th Baker, Alan Hales · IEEE Design & Test of Computers · 1995
IDDQ testing is expected to make an important breakthrough as the mainstream CMOS test technology. However, before this happens it must be feasible to make at least a few hundred IDDQ measurements in the fleeting seconds of an IC's production test. QTAG is an initative to develop IDDQ test instrumentation for present ATE systems to solve this problem.