Built-in hardware pseudo-random test module for Physical Unclonable Functions
Jae Seong Lee, Piljoo Choi, Song-Ju Kim, Byong‐Deok Choi, Dong Kyue Kim · Nonlinear Theory and Its Applications IEICE · 2014
PUFs, that self-generate random numbers, are used in identification or authentication applications for two reasons: cost and security. Since the randomness of PUFs in individual chips may differ, PUFs in some chips may generate somewhat less than random values. Defects during manufacturing may also affect the randomness of PUFs. In either case, confidential information based on PUFs could be vulnerable to security threats. Thus, it is necessary to identify both failing chips during manufacturing and PUFs which are not sufficiently random. To test the randomness of PUFs in a chip, we have designed a dedicated random test module optimized for hardware implementation. Finally, by implementing the module in real PUFs, we verified its validity.