Inverse analysis for magnetic field source searching in thin film conductor
Yoichi Midorikawa, Jun Ogawa, Toshiyuki Doi, S. Hayano, Yoshitaka Saito · IEEE Transactions on Magnetics · 1997
Previously, we have proposed the sampled pattern matching (SPM) method solving for the inverse problem. In the present paper, we propose a generalized SPM method. The generalized SPM method makes it possible to estimate both the direction and magnitude of currents. We apply this new method to the current estimation in a thin film conductor. Numerical simulation suggests the validity of the method. As a result, this paper presents an effective methodology to estimate a current distribution in a thin film conductor.