Automatic linearity and frequency response tests with built-in pattern generator and analyzer
Foster Fa Dai, Charles E. Stroud, Dayu Yang · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2006
We present a built-in self-test (BIST) approach based on a direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. A main contribution of this paper is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) and frequency response, including both phase and gain. The approach has been implemented in Verilog and synthesized into a field-programmable gate array (FPGA), where it was used for functional testing of an actual device under test (DUT) and compared to simulation results.