A dynamic test method for high-resolution A/D converters
Tina M. Souders · IEEE Transactions on Instrumentation and Measurement · 1982
A dynamic test method is described for A/D converters having up to 16 bits of resolution. The technique exercises the test converter with stepped input changes, simulating the output of an S/H amplifier. Dynamic errors as low as 4 ppm can be measured within 4 ßs following a step change as large as 20 V.