Alternative built-in self-test (BIST) structures for analogue circuit fault diagnosis
C.-L. Wey · Electronics Letters · 1991
To increase the number of test points, while still keeping low pin overhead, an alternative built-in self-test (BIST) structure using current copiers is presented. The BIST structure allows simultaneous sampling of either voltage or current test data at various test points and shifting the data for fault diagnosis and testing.