Testing of a NORA CMOS serial-parallel multiplier
Magdy Bayoumi, Nam Ling · IEEE Journal of Solid-State Circuits · 1989
The NORA-CMOS (no-race complementary metal-oxide-silicon) serial-parallel multiplier presented here is testable. Error detection is achieved at two levels: online functional testing and offline structural testing. Functional testing uses low-cost residue codes to detect errors at the overall level. Modulus is adopted as the check base. For structural testing, a NORA CMOS circuit error detection technique proposed based on the structure, properties, and operations of NORA CMOS is used. The proposed technique can detect output stuck-at, stuck-open, and stuck-on faults. Such a two-level testing strategy reduces test time and chip area overhead, identifies faulty locations, and has the ability to detect both transient and permanent faults.>