Optimal fault detection for analogue circuitsunder manufacturing tolerances
Georges E. Gielen, Zhigang Wang, Willy Sansen · Electronics Letters · 1996
An optimal method for analogue fault detection is presented. Instead of using arbitrary decision windows, the method fully considers the VLSI manufacturing tolerances and mismatches to minimise the probability of erroneous test decision. A-priori simulated probability information is combined with the actual measurement data to decide whether the circuit is fault-free or faulty. Experimental results show the effectiveness of the proposed technique.