Multi-frequency Test for analog circuits
Cheng Wang, Yun Ye, Hailang Liang, Jin He, Mansun Chan · 2013
In this paper, multi-frequency test is presented, which can maximize differences between the failure state and the normal state of the analog circuit's response. Using sensitivity analysis, the multi-frequency test vectors of the circuit under test(CUT) are generated and chosen. The experimental results show that this approach is very effective and highly practical for multi-frequency test vectors of the analog circuits.