Automatic selection of efficient observability points in combinational gate level circuits using particle swarm optimization
Hossein Ardeschir Ghofrani, F. Javaheri, Saeed Safari, Zainalabedin Navabi · 2010
The ever-increasing size of digital circuits makes the process of testing such designs more complex everyday. This complexity leads to more complicated logic cones, which results in harder to control and observe nodes in digital circuits. Reduced controllability and observability will decrease circuit's fault coverage, resulting in harder to test circuits.