A Scan-Based On-Line Aging Monitoring Scheme
Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue · JSTS Journal of Semiconductor Technology and Science · 2014
In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.