BA-BIST: Board test from inside the IC out
Zoe F. Conroy, Alfred L. Crouch · 2013
With shrinking geometries of PCBs, increasing interface speeds and corresponding loss of test point access to diagnose structural test defects, new standard test mechanisms are needed to test chip-to-chip connectivity and functionality at the board level. New requirements for an integrated circuit `BA' (Board-Assist) BIST to structurally test these interfaces will be presented. A standardized BA-BIST template and algorithms for industry leverage are proposed.