On Captureless Delay Test Points
Claude Thibeault, Yassine Hariri, Christelle Hobeika · 2009
In this paper we present a new technique called captureless delay testing points (CDTP). This technique allows the detection of delay faults left uncovered by launch-on-capture transitions, with top-off random launch-on-shift patterns that do not require fast switching scan enable signals. The CDTP random patterns are internally generated, requiring virtually no additional test time or memory tester. Area/performance overhead and technical obstacles to automation are minimal. Results show that CDTP provides appreciable coverage increase with minimum overhead.