Low Cost RF Signal Generation for BIST
Marcelo Negreiros, Álisson Martinelli Michels, Luigi Carro, Altamiro Susin · Conference proceedings · 2006
In this work a low cost approach for the generation of RF test signals for analog BIST is proposed. As a single bit signal is generated and applied to the RF path, only a single bit DA converter is needed. The approach takes advantage of the limited bandwidth in RF signal paths. Analysis of the proposed technique and comparison to other approaches are provided. Simulation and practical results illustrate the performance of the proposed signal generation method.