Optimization of burn-in test for many-core processors through adaptive spatiotemporal power migration
Minki Cho, Nikhil Sathe, Arijit Raychowdhury, Saibal Mukhopadhyay · 2010
We present adaptive spatiotemporal power migration (ASTPM) for burn-in of many core chips. ASTPM adapts the number of simultaneously stressed cores and dynamically varies their location to prevent thermal runaway, improve test-quality, and optimize burn-in time.