Parallel processing for analogue fault diagnosis
Chin‐Long Wey · International Journal of Circuit Theory and Applications · 1988
Abstract The computer‐aided testing (CAT) problem is inherently a large scale systems problem, it is essential to exploit whatever computational power is available to reduce the computational requirements for both on‐line and off‐line test processes. In particular, digital CAT algorithms often use some degree of parallel processing in their implementation. Therefore, the degree to which an analogue CAT algorithm can be implemented in parallel becomes a significant factor in determining its viability. In this paper, a parallel test algorithm and the associated architecture for the test system for analogue circuits and systems are proposed. the proposed test algorithm is applicable to testing multiple faults. Based on a combinatorial covering set approach, the conditions for the non‐sequential execution of the test algorithm is analysed and the parallel processing to generate the test results is also addressed. Although this paper is motivated on the discussions of analogue fault diagnosis, the proposed parallel algorithm and the combinatorial covering approach can also be applied to digital testing.