Condensed Linear Feedback Shift Register (LFSR) Testing—A Pseudoexhaustive Test Technique
Laung‐Terng Wang, McCluskey · IEEE Transactions on Computers · 1986
This paper presents a design technique for linear feedback shift registers that generate test patterns for pseudoexhaustive testing. This technique is applicable to any combinational network in which none of the outputs depends on all inputs. It does not rewire the original network inputs during in-circuit test pattern generation. Thus, the possibility of undetected faults on some inputs is eliminated.