Design of a Built-in Multi-mode ICs Tester with Higher Testability Features—A most Suitable Testing Tool for BIST Environment
Afaq Ahmad, Amer H Al-Habsi · IETE Technical Review · 1998
This paper describes a simple elegant design method to realize a built-in multi-mode ICs tester. The designed tester is capable of providing higher level of testability for testing the circuits in BIST environment. The proposed design approach is demonstrated by implementing the multi-mode tester's design on GAL16V8 chip.