Effectiveness of very low voltage testing of bridging defects
Rosa Rodriguez-Montanes, Daniel Arumí, Joan Figueras · Electronics Letters · 2006
Low supply voltage testing has traditionally been reported as an advantageous technique in detecting resistive bridging defects in combinational CMOS circuits. However, under certain topological conditions, the opposite effect is observed. These conditions are analysed. Applicability to diagnosis of bridging defects is discussed.