Synthesis of Optimal Ambiguity Resolver Functions
Mehta, Smith · IEEE Transactions on Computers · 1977
Large-scale integration (LSI) circuits impose particular constraints and present special opportunities for improving the diagnostic resolution of a digital system. In particular, bond failures represent a very significant failure mode in integrated circuits, so it is important to be able to identify a fault on an input/output lead to a single bus of a least replaceable unit, and it is desirable to do this using a minimum number of test points.