Pseudo-Exhaustive Testing
Xin Fu, Shu Ai Fu · Advanced materials research · 2013
There are many test generation algorithms currently. With continuously increasing of circuit scale, complexities of these algorithms are also increasingly sharply. Simple algorithms based on circuit structure, including exhaustive testing and pesudo-exhaustive testing, and simplicity of generation of test vector are more and more highlighted by scientific researchers and scholars. The dissertation mainly analyzes pseudo-exhaustive testing.