Risks of rapid application development
Ritu Agarwal, Jayesh Prasad, Mohan Rao Tanniru, John Patrick Lynch · Communications of the ACM · 2000
article Free Access Share on Risks of rapid application development Authors: Ritu Agarwal Robert H. Smith School of Business, University of Maryland, College Park, MD Robert H. Smith School of Business, University of Maryland, College Park, MDView Profile , Jayesh Prasad Department of MIS and Decision Sciences, University of Dayton, Dayton, OH Department of MIS and Decision Sciences, University of Dayton, Dayton, OHView Profile , Mohan Tanniru Applied Technology in Business Program at Oakland University, Rochester, MI Applied Technology in Business Program at Oakland University, Rochester, MIView Profile , John Lynch Vertechs Software Solutions, Atlanta, GA Vertechs Software Solutions, Atlanta, GAView Profile Authors Info & Claims Communications of the ACMVolume 43Issue 11esNov. 2000 pp 1–eshttps://doi.org/10.1145/352515.352516Published:01 November 2000Publication History 14citation7,745DownloadsMetricsTotal Citations14Total Downloads7,745Last 12 Months977Last 6 weeks134 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF