A Built-in Method to Repair SoC RAMs in Parallel
Tsu-Wei Tseng, Jin-Fu Li, Chih-Sheng Hou · IEEE Design & Test of Computers · 2010
Editor's note:Built-in-self-repair is an enabling approach for improving memory yield in system-on-chip designs. Reducing the overhead of repair circuits while minimizing the test and repair time is of prime importance. This article presents a fast parallel repair methodology for SoC memory cores and an associated automation framework.—Swarup Bhunia, Case Western Reserve University